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4.3.2. Phase-Contrast Images
4.3.2.1. INTRODUCTION
Contrast in TEM images can arise
due to the differences in the phase of
the electron waves scattered through
a thin specimen.
This contrast mechanism can be difficult
to interpret because it is very sensitive to
many factors: the appearance of the image
varies with
small changes in the thickness,
orientation, or scattering factor of
the specimen,
and variations in the focus or
astigmatism of the objective lens.
However, its sensitivity is the
reason phase contrast can be
exploited to image the atomic
structure of thin specimens.
Of course, this also requires:
a TEM with sufficient resolution to
detect contrast variations at atomic
dimensions,
and the proper control of
instrument parameters that affect
the phases of the electrons passing
through the specimen and the
lenses.
If you know what you are doing, the
procedures can be straightforward;
the level of operator skill necessary
to obtain such images can be
acquired with practice by most TEM
users.
The most obvious distinction
between phase-contrast imaging
and other forms of TEM imaging
is
the number of beams collected by
the objective aperture or an
electron detector.
As described in the previous chapters,
a BF or DF image requires that we
select a single beam using the
objective aperture.
A phase-contrast image requires the
selection
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