中科大高等固体物理——STM.pdf

专题二：扫描隧道显微学 Scanning Tunneling Microscopy(STM) The Microscope “Urge to See More” Scale Electron Microscopy • beams of electrons are used to produce images • wavelength of electron beam is much shorter than light, resulting in much higher resolution The Transmission Electron Microscope • electrons scatter when they pass through thin sections of a specimen • transmitted electrons (those that do not scatter) are used to produce image • denser regions in specimen, scatter more electrons and appear darker EM 分辨率: 约1纳米 1931年 Ebola The Scanning Electron Microscope • uses electrons reflected from the surface of a specimen to create image • produces a 3-dimensional image of specimen’s surface features a coloured scanning electron micrograph (SEM) of the head of a fruit fly Newer Techniques in Microscopy • confocal microscopy and scanning probe microscopy • have extremely high resolution • can be used to observe individual atoms Confocal Microscopy • originally patented by Marvin Minsky in 1957 • laser beam used to illuminate spots on specimen • computer compiles images created from each point to generate a 3-dimensional image Scanning Probe Microscopy • scanning tunneling microscope – steady current (tunneling current) maintained between microscope probe and specimen – up and down movement of probe as it maintains current is detected and used to create image of surface of specimen The Scanning Tunneling Microscope works like a record player… 分辨率: 约0.01纳米 1981年