ARINC659总线接口组件抗单粒子翻转加固 设计及试验验证.pdfVIP

Journal of Aerospace Science and Technology 国际航空航天科学, 2017, 5(2), 90-98 Published Online June 2017 in Hans. /journal/jast /10.12677/jast.2017.52011 Design and Experiment of Single Event Upset Hardened ARINC659 Bus Interface Components Luyuan Wang, Weiwei Liu, Ke Xu Beijing Institute of Spacecraft System Engineering, Beijing th th th Received: Jun. 8 , 2017; accepted: Jun. 25 , 2017; published: Jun. 29 , 2017 Abstract ARINC659 as a standard multipoint serial communication bus, and with the advantage of more general, high efficiency and reliability, has increasingly become the idea selection of backplane bus within the computer of spacecraft avionics system. This paper based on the study of ARINC659 bus architecture and underlying communication mechanism, identifies the sensitive of single event upset for ARINC659 bus interface components applied to space radiation environment, and a set of targeted reinforcement design is put forward for single event upset hardened. Finally, the correction and validity of the reinforcement design are verified by ground simulation experiment, which shows that ARINC659 bus interface components after reinforcement design meet the appli- cation in the radiation environment and provide the basis for the application of ARINC659 bus in aerospace. Keywords Backplane Bus, ARINC659, Single Event Upset, Avionics ARINC659总线接口组件抗单粒子翻转加固 设计及试验验证 汪路元，刘伟伟，徐 轲 北京空间飞行器总体设计部，北京 收稿日期：2017年6月8 日；录用日期：2017年6月25 日；发布日期：2017年6月29 日 文章引用: 汪路元, 刘伟伟, 徐轲. ARINC659 总线接口组件抗单粒子翻转加固设计及试验验证[J]. 国际航空航天科学, 2017, 5(2): 90-98. /10.12677/jast.2017.52011