复旦微电子-专用集成电路设计方法-Dftba.pptVIP

  Design-For-Test Seminar  Design-for-Test Basics Outline Meaning and importance of Design-for-Test DFT terminology Types of tests Fault modeling and detection Test pattern generation Internal scan design Boundary scan design Built-in self-test (BIST) design Yield and Defect Level Testing and Cost Low number of defective parts per million (DPM) is very critical Cost to replace parts grows exponentially throughout design cycle Cost of bad part in critical device (for example, an airplane) is immeasurable! What is Testability? An attribute of a design The ability to create a test program