Review Of Noise In Semiconductor Devices英文电子书.pdf

REVIEW OF NOISE IN SEMICONDUCTOR DEVICES AND MODELING OF NOISE IN SURROUNDING GATE MOSFET END–QUARTER REPORT OF THE WORK DONE BY BIPIN RAJENDRAN UNDER THE GUIDANCE OF PROF. FABIAN PEASE DEPARTMENT OF ELECTRICAL ENGINEERING STANFORD UNIVERSITY DECEMBER 2001 Contents Introduction 3 Mathematical Background on Noise 4 Noise in Semiconductor Devices 5 Thermal Noise 5 Shot Noise 7 Flicker Noise 9 Random Telegraph Signals 11 Review of Device Structure and Noise modeling of Surrounding Gate MOSFET 12 Surrounding Gate MOSFET Device Structure 12 Noise Modeling of SGT 14 Simulations and Results 15 Discussion 23 References 24 2 Introduction The sensitivity of electrical systems is limited by noise. A very important source of noise in electronic systems is th