外文翻译---一种基于DS18B20的温度探测系统.docxVIP

附录ⅢA Design of the Temperature Test System Basedon Grouping DS18B20AbstractAll the DS18B20 sensors, used for the multipoint test temperature, are connected with MCU on one of IO bus, and temperature data are collected by turns. If the system has a large amount of sensors, the time of MCU used in processing the temperature data is obviously prolonged, so the cycle of alternate test gets longer. In this paper, a new method that DS18B20 are rationally grouped is presented, and some measures are taken in software; as a result, the speed of alternate test advances distinctly.Key words- DS18B20 Group, temperature test, time spent on the alternate test.1. INTRODUCTION As the simple structure, convenient installment, low loss and wide range of temperature test, DS18B20 temperature test sensors are applied to the fields which need the multipoint temperature test, such as the chemical industry, the grain, the environment supervision and so on. Because of the adoption of one bus in the DS18B20 multipoint temperature test system, all DS18B20 are hung on one bus, and then the temperature conversion value of each test point is read by turns. As the conversion value must be read after reading-pin state for 8 times, and position and store data must be moved, so time spend much in reading one point of the data system by every time. If the temperature test system is large-scaled, the system loss caused by it is rather much, and then the alternate test speed of the system decreases obviously, which influences the efficiency of the multipoint temperature test system seriously. In this paper, DS18B20 are hung on some I/O buses by grouping DS18B20 evenly, and the conversion temperature data is obtained by reading the state of DS18B20, then the system loss decreases and the alternate test speed increases obviously, which won’t influence the precision and the reliability of the conversion. A set of multipoint temperature test of artificial environment laboratory is achieved in this paper,