- 1、本文档共36页,可阅读全部内容。
- 2、原创力文档(book118)网站文档一经付费(服务费),不意味着购买了该文档的版权,仅供个人/单位学习、研究之用,不得用于商业用途,未经授权,严禁复制、发行、汇编、翻译或者网络传播等,侵权必究。
- 3、本站所有内容均由合作方或网友上传,本站不对文档的完整性、权威性及其观点立场正确性做任何保证或承诺!文档内容仅供研究参考,付费前请自行鉴别。如您付费,意味着您自己接受本站规则且自行承担风险,本站不退款、不进行额外附加服务;查看《如何避免下载的几个坑》。如果您已付费下载过本站文档,您可以点击 这里二次下载。
- 4、如文档侵犯商业秘密、侵犯著作权、侵犯人身权等,请点击“版权申诉”(推荐),也可以打举报电话:400-050-0827(电话支持时间:9:00-18:30)。
查看更多
硅-氧化锌异质结
J. Phys. Chem. C, Vol. 114, No. 35, 2010 Working electrode: Si substrate; Reference electrode: Saturated calomel electrode; Deposition bath: 0.1 M KCl and 0.2 mM ZnCl2 saturated with molecular oxygen T=90℃ Back Reverse bias of -1V with visible light illumination with UV light illumination APPLIED PHYSICS LETTERS 97, 013503 (2010) APPLIED PHYSICS LETTERS 90, 243106 (2007) First , deposit ZnO crystalline seeds by sol-gel technique ;than grow ZnO nanostructures by hydrothermal method SiOx:2nm Depositing ZnO thin ?lms on p-Si (111) substrates by magnetron sputtering JOURNAL OF APPLIED PHYSICS 107, 083701 (2010) APPLIED PHYSICS LETTERS 94, 013503 (2009) Silicon core:Ag-induced electroless etching ZnO shell:atomic layer deposition APPLIED PHYSICS LETTERS 98, 033102 (2011) Without or with ZnO seed and annelling J. Vac. Sci. Technol. B 27(2), Mar/Apr 2009 Atomic layer deposition (ALD) J. Phys. D: Appl. Phys. 43 (2010) 345101 (4pp) Back I:thermally generated carrier tunneling; II:recombination-tunneling mechanism; III:space-charge-limited current (SCLC) JOURNAL OF APPLIED PHYSICS 105, 114504 (2009) Solar Energy Materials Solar Cells 93 (2009) 1417–1422 Aluminum-doped zinc oxide ?lms were deposited on Si substrates by SCSD method 1.pure ZnO after RPP 2.RPP 1 at%Al-doped ZnO/Si 3.as-grown 1 at%Al-doped ZnO/SiO2/Si 4.RPP 1%Al-doped ZnO/SiO2/Si solar cells 5.RPP 1%Al-doped ZnO/SiO2/Si++solar Thermal evaporation of ZnO powder Nanotechnology 21 (2010) 475703 (6pp) 溶胶凝胶法(醋酸锌+聚乙烯醇)-旋图在硅片上-120°空气中烘干-重复6次 * the donorlike deep traps were emp- tied in the depleted region. As the forward bias applied, elec- trons on the conduction band of ZnO may ?rst fall into these empty traps and subsequently, recombined with holes in- jected from p-Si side, giving rise to the emission of 580 nm. When the voltage was above 2.8 V, holes in p-Si side commenced to inject and recombined with electrons via deep-level stat
文档评论(0)