单颗粒ICP-MS测定铁纳米粒子利用通用池技术消除光谱-珀金埃尔默.PDFVIP

应 用 文 章 ICP - Mass Spectrometry 作者: Chady Stephan Aa ron Hineman PerkinElme r, Inc. Shelton, CT 单颗粒ICP-MS测定 铁纳米粒子：利用通用池 引言 随着纳米颗粒兴趣的增加，各种测试 技术消除光谱干扰 方法正被应用。采用单颗粒模式电感 耦合等离子体质谱法 （ ）分 SP-ICP-MS 析金属纳米粒子成为最有前途的技术之一。由于其高灵敏度、易用性和分 析速度快等特点，ICP-MS是一种理想的技术，用于检测纳米颗粒的特性： 无机成分、浓度、尺寸大小、粒度分布和聚集等。 ICP-MS分析挑战之一为干扰导致错误的分析结果。然而，这并非是一个 问题，因为迄今为止大多数SP-ICP-MS应用均没有涉及到基体干扰或常规 光谱干扰问题。例如，金和银纳米粒子在工业中应用较广，未受到常规干 扰。另外，大多数纳米颗粒存在简单基体中，该基体几乎不产生干扰。随 着纳米技术领域的拓展，分析需求增加，尤其是需要测定纳米颗粒中受干 As the field of nanotechnology is expanding, the analyticalAs the field of nanotechnology is expanding, the analytical Results and DiscussionResults and Discussion requirements are increasing, particularly, the need to measurerequirements are increasing, particularly, the need to measure Since gold nanoparticles have been well characterized, these wereSince gold nanoparticles have been well characterized, these were 扰的元素，如扩展为其它受干扰的金属纳米粒子，如 结果与讨论 nanoparticles containing elements which have commonnanoparticles containing elements which have common first run in Standard mode to establish baseline performance. Tofirst run in Standard mode to establish baseline performance. To interferences, such as titanium, iron or silicon. As an example,interferences, such as titanium, iron or silicon. As an exam