掺杂稀土钙钛矿钴氧化物的制备及物性研究-物理电子学专业论文.docxVIP

万方数据 万方数据 Subject : Preparation and physical property research of rare-earth doped perovskite cobaltites Specialty : Physical electronics Name : Gu Ao (Signature) Instructor : Zhao Shenggui (Signature) ABSTRACT In this paper, thin films of (La1-xPrx)0.7Sr0.3CoO3 (x=0, 0.2, 0.4, 0.6, 0.8) and La0.82Sr0.18Co1-xCrxO3(x=0, 0.2, 0.4, 0.6, 0.8, 1.0) have been deposited using pulsed laser deposition (PLD) method from targets prepared by the solid state reaction technology, the substrates are single crystal LaAlO3 (100). Thin films analyzed by X-ray diffraction (XRD) and atomic force microscope (AFM), then we measured the temperature dependences on the resistance in all the films, and so on. The main works and conclusions are as follows: We analyzed the structure of (La1-xPrx)0.7Sr0.3CoO3 (x=0, 0.2, 0.4, 0.6, 0.8) and La0.82Sr0.18Co1-xCrxO3 (x=0, 0.2, 0.4, 0.6, 0.8, 1.0) targets prepared by the solid state reaction technology with XRD. (La1-xPrx)0.7Sr0.3CoO3 (x=0, 0.2, 0.4, 0.6, 0.8) thin films have been deposited using PLD method, and the preparation process is introduced. We analyzed the structure and the surface topography of thin films using XRD and AFM, respectively, then measured the temperature dependences on the resistance in all the films, and the photo-induced resistance effects of films, at different temperatures, irradiated by 532nm laser with different intensity. La0.82Sr0.18Co1-xCrxO3 (x=0, 0.2, 0.4, 0.6, 0.8, 1.0) thin films have been deposited using PLD method, and the preparation process is introduced. We analyzed the structure and the surface topography of thin films using XRD and AFM, respectively, then measured the temperature dependences on the resistance in all the films, and the photo-induced resistance effects of all the films irradiated by 532nm laser with different intensity at different temperatures. Key words : Perovskite cobaltites; film; transport property; photo-induced resistance Thesis : Funda