A comprehensive model of PMOS NBTI degradation电子书.pdfVIP

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A comprehensive model of PMOS NBTI degradation电子书.pdf

Microelectronics Reliability 45 (2005) 71–81 /locate/microrel A comprehensive model of PMOS NBTI degradation M.A. Alam a,*, S. Mahapatra b a Agere Systems, Allentown, PA, USA b Department of Electrical Engineering, IIT, Bombay, India Received 13 November 2003; received in revised f

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