基于IDDQ扫描的模拟和混合集成电路可测性设计报告.docxVIP

电子系统故障诊断与测试性课程设计 学生姓名 学　　号 专　　业 测控技术与仪器 DFT for Analog and Mixed Signal IC Based on IDDQ Scanning 基于IDDQ扫描的模拟和混合集成电路可测性设计 Abstract—The cost of integrated circuits increases with the complexity and integration density. This has led designers to consider testing from the design phase; that’s what we call DFT(design for testability). In this paper, we propose a DFT solution,based on technique of IDDQ measuring current, by incorporating a Built-In Current sensor, whose function is to detect power consumption of different circuits under