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Review aRticle | focus
publisheD online: 30 noVeMber 2010 | Doi: 10.1038/nphoton.2010.267
nanoscale X-ray imaging
anne sakdinawat* and David attwood
Recent years have seen significant progress in the field of soft- and hard-X-ray microscopy, both technically, through develop-
ments in source, optics and imaging methodologies, and also scientifically, through a wide range of applications. While an
ever-growing community is pursuing the extensive applications of today’s available X-ray tools, other groups are investigating
improvements in techniques, i
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