IC Manufacturing and Yield知识讲稿.pptVIP

IC Manufacturing and Yield;Production Efficiency;Variability;Deformations;Outline;Statistical Process Control;Control Charts;Control Chart for Attributes;Defect Chart;Control Limits for C-Chart;Control Limits for C-Chart;Example;Defect Density Chart;Control Limits for U-Chart;Example;Control Charts for Variables;Control of Mean and Variance;Control Limits for Mean;Control Limits for Variance;Modified Control Limits for Mean;Example;Example;Outline;Background;Comparing Distributions;Hypothesis Testing;Results;Analysis of Variance;ANOVA Example;Sums of Squares;Degrees of Freedom;Mean Squares;ANO