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ABSTRACT
ABSTRACT
The magnetic thin film can be widely used in various fields of the high-speed
electronics industry, such as: information storage, electromagnetic compatibility,
magnetic field sensors, microwave communications devices. With the miniaturization
and the development of the high-frequency magnetic thin film devices, the measurement
of magnetic thin film magnetic high frequency is particularly important.
The high microwave frequency characteristics, temperature characteristics, and
ferromagnetic resonance linewidth of the magnetic material are one of the key elements
of the research at home and abroad. The complex permeability of magnetic material is
basic parameter of the material, and its accurate measurement is the key of the research,
design and application of the magnetic device. This paper is aimed at the measuring
technology of the complex permeability of magnetic material, carried out the following
work.
Firstly, the formula of short microstrip line method based on transmission line
theory is derived, and electromagnetic simulation software HFSS simulation analysis of
the measurement model, based on the simulation results demonstrate the feasibility of
the test method. Then specifically research the impact of the test sample size and the
placement of the sample during the test . The results show that : the width of the
conductor of the microstrip line on the test fixture is 5 mm; air dielectric layer having a
thickness of 1 mm; bearer sample film thickness of the substrate that loads sample film
i
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