《SJT10566-1994-可测性总线第一部分：标准测试存取口与边界扫描结构》.pdfVIP

[.67 中华人 民共和 国电子行业标准 SJ/T10566-94 可测性总线 第一部分:标准测试存取口 与边界扫描结构 Testabilitybus PartI:Standardtestaccessportand boundaryscanarchitecture 1994-08-08发布 1994-12-01实施 、中华人民共和国电子工业部 发 布 目 次 1 主题内容与适用范围 ·········································，·······················，····…·… (1) 1.1 主题内容 ·····················································································…… (1) 1.2 适用范围 ··············································，··························，·············…… (1) 2 概述 ·······························································································一 (1) 2.1 操作概述 ·····················································································…… (1) 2.2 组装产品的测试应用 ·········································，·····························…… (2) 2.3 其它目标的测试应用 .·(4) 2.4 本标准结构 ······················································································。… (4) 2.5 约定 ·······················································································，····…… (4) 2.6 术语 ·····························································································…… (5) 3 测试存取口 ···················································，································…… (7) 3.1 形成测试存取口的连接 ····································································…·… (8) 3.2 测试时钟输入(TCK)·······一· (8) 3.3 测试方式选择输入((TMS)···························二···，·································…·… (9) 3.4 测试数据输入(TDI) ······················，·················································…… (9) 3.5 测试数据输出(TDO)·································，···············，·····················…… (9) 3.6 测试复位输入(TRST，)················