电子背散射衍射技术的特点跟发展动向资料精.pdfVIP

Analytics with Scanning Electron Microscopy A. Danilewsky • Energy Dispersive X-Ray Analysis EDX • Electron Back Scatter Diffraction EBSD Depth of Signals Sample surface Auger - elektrons Secondary electrons SE Back scatter electrons BSE X – rays: - Characteristic X - rays - Continuum X