2002 Degradation and failure of organic light-emitting devices英文学习资料 .pdfVIP

Degradation and failure of organic light-emitting devices Lin Ke, Soo-Jin Chua, Keran Zhang, and Nikolai Yakovlev Citation: Appl. Phys. Lett. 80, 2195 (2002); doi: 10.1063/1.1464216 View online: /10.1063/1.1464216 View Table of Contents: /resource/1/APPLAB/v80/i12 Published by the AIP Publishing LLC. Additional information on Appl. Phys. Lett. Journal Homepage: / Journal Information: /about/about_the_journal Top downloads: /features/most_downloaded Information for Authors: /authors Downloaded 09 Aug 2013 to 7. This article is copyrighted as indicated in the abstract. Reuse of AIP content is subject to the terms at: /about/rights_and_permissions APPLIED PHYSICS LETTERS VOLUME 80, NUMBER 12 25 MARCH 2002 Degradation and failure of organic light-emitting devices Lin Ke, Soo-Jin Chua,a) Keran Zhang, and Nikolai Yakovlev Institute of Materials Research and Engineering, 3 Research Link, Singapore 117602 Received 16 July 2001; accepted for publication 24 January 2002 The degradation and failure of organic light-emitting device are observed via optical microscopy. The ‘‘degraded area’’ has been identified to be made up of three regions: 1 a dark spot at the center, 2 a nonemitting area forming the core, and 3 a weakly emitting area surrounding the core. It is found that due to metal migration, as evidenced from the secondary ion mass spectrometry profiles, the indium tin oxide/polymer interface roughens during operation. The intense local current at sharp points degrades the polymer causing the formation of the dark center. Further current stress caused the central core to carbonize which may lead to short and/or open circuits accompanied by fluctuations in the device current. © 2002 Am