芯片测试原理.pptx

IC Test Fundamental ;Course Contents ;Lesson 1: Overview of IC Test;Test category; Military Testing — Involves performing rigorous testing over a temperature range and documenting the results. Incoming Inspection — Testing of devices by a customer to insure the quality of the devices purchased before using them in an application. Assembly Verification — Verifies that the devices survived the assembly process and that they were assembled correctly. The tests performed during assembly verification are similar to that of package testing and may be a subset of package testing. This activity is usually performed offshore. Failure Analysis — The process of analyzing device failures to determine why the device failed. Determining the cause of a failure yields information that can improve device reliability.;The Test System;The Test System;The CPU is the system controller. It contains the computer which controls the test system and provides a means of moving data into and out of the test system. Most new test systems offer a network interface as well as magnetic media for data transfers. The hard disk and CPU memory are used to store information locally; the video display and keyboard are used by the test operator to interact with the test system. The DC subsystem contains the Device Power Supplies (DPS), the Reference Voltage Supplies (RVS) and the Precision Measurement Unit (PMU). The DPS supplies voltage and current to the DUT power pins (VDD/VCC). The RVS supplies voltage references for logic 0 and logic 1 levels to the driver and comparator circuitry located on the pin electronic cards. These voltages set VIL, VIH, VOL and VOH. Less expensive and older test systems may have a limited number of RVS supplies, so only a limited number of input and output levels can be programmed at one time. When tester pins share a resource such as the RVS, that resource is considered a shared resource. Some test systems are said to have a tester per pin architecture which means that the