IC探针图像模式识别与测距技术分析.pdfVIP

英文摘要 IC 探针图像模式识别与测距技术研究 Image Recognition and Distance Measurement of IC Probes Abstract Combined with the needs of the production line in the industrial sector, this paper takes two different kinds of IC probes as research objects, and respectively studies the relevant techniques and methods of pattern recognition and distance measurement of the IC probe images, with the development of the probe automatically check system which is based on the image pattern recognition and the probe distance measurement software witch is based on image processing. In the aspect of the vertical type IC probe pattern recognition: the size and the shape features of the probe samples belonging to different molds are analyzed in detail, the shape feature parameters are proposed to recognize the different molds of probes according to their shape features, and the probe feature database is established; this paper introduces a probe shape feature extraction method in detail, with 16 molds of probes which belong to three series as examples; probe pattern recognition system is developed using MATLAB, and experiments indicate that the system has the functions of mage acquisition, image preprocessing, feature extraction, pattern recognition and alarming. In the aspect of the cantilever type IC probe distance measurement: based on the features of the probes and backgrounds in the production line, the suitable algorithms of probe image preprocessing which includes image denoising, image segmentation and morphology operations are studied, removing the background interference effectively; according to the topology features of probe binar