MIL-STD-202G Method 310(中文版).docVIP

MIL-STD-202G METHOD 310 CONTACT-CHATTER MONITORING接點抖動監測 1. PURPOSE. This test is conducted for the purpose of detecting contact-chatter in electrical and electronic component parts having movable electrical contacts, such as relays, switches, circuit breakers, etc., where it is required that the contacts do not open or close momentarily, as applicable, for longer than a specified time-duration (see 4.3) under environmental test conditions, such as vibration, shock, or acceleration. This test method provides standard test procedures for monitoring such opening of closed contacts or closing of open contacts. 1.目的:這測試執行確定在電器和電子零件部份有作切換電器接觸時的接點抖動目的,如繼電器,開關,電流斷路器,等。接觸的地方不能有短暫的斷開或導通。如適用的環境試驗條件下,特定的持續長時間期間(見4.3),如:振動,衝擊或加速。這檢驗方法提供標準測試程序對於監測如”閉合接點打開”或 ”打開接點閉合”兩種測試電路。 2. TEST CIRCUITS. 2.測試電路 2.1 Selection. In this method there are two test-circuits: A (see 3.1), and B (see 3.2). The selection of the test-circuit depends largely upon the type of electrical contacts to be tested. Test-circuit B is preferred, whenever possible, to avoid contact contamination caused by the formation of carbonaceous deposits on the contacts. The individual specification shall specify the test-circuit and time-duration (see 4.3) required in connection with monitoring of shock and vibration tests. The test-circuits listed herein are recommended reference circuits. Any comparable test-circuit which meets the test requirements and the calibration procedures as stated herein , may be used for this test. 2.1選擇.這方法有兩個測試電路:A(見3.1),和B(見3.2)。測試電路的選擇取決於主要根據電氣接觸的類型來做測試。測試電路B是首選的, 盡可能, 以避免接觸形成的積炭造成的接觸污染。特定規格應註明衝擊的監測和震動測試時測試電路和持續時間的要求。呈列於此的測試電路為建議的參考電路。任何類似的測試電路都應符合本文中指定的測試要求和校正程序,才能被用作使用測試。 2.1.1 Selection of test-circuit A. Test-circuit A is for monitoring test-specimens with a single set of contacts, for the opening of normally-closed contacts or false closures of normally- opened contacts (see figure 310-1). Test-circuit A should not be specified for specimens whose capabi