Presentation 75 - 利用示波器的眼图轮廓方法分析高速串行数字信号.pdfVIP

Using Eye Contours in Scopes to Analyze High-Speed Serial Digital Signals Qiujie Lu （陆秋捷） Senior Application Engineer qiu-jie_lu@ Keysight Technologies. Eye Diagram and Mask Test The Most Common Test for High Speed Interfaces – Allows to see component performance over a broad combination of data patterns and conditions in a single display – When combined with mask test, it provide a quick, convenient and intuitive way for signal quality evaluation and validation – How to get the mask? • Standard masks provided with scope • Generate masks automatically from current input signal • Custom masks – When failure occurred, Keysight Infiniium series scopes support unfolding the eye diagram for further debug and analysis EDICON 2018 Page 2 New Measurements from JEDEC DDR4 and LPDDR4 Rx Input Masks – DDR4 and LPDDR4 receiver requirements is defined by masks instead of setup and hold time and DC voltage swings. – Slew rate derating is no longer applicable – Masks is defined by VdIVW_total and TdIVW_total (DQ), and VcIVW_total and TcIVW_total (CMD/ADDR) EDICON 2018 Page 3 New Specification for Eye Mask from JEDEC Eye Mask Test on a Lower BER Level BER is the probability that the DRAM will sample outside of the mask region. voltage BER contour Mask defines the region DRAM e Rx is most likely to sample s i input/write signal o n l a n r Vcent e