基于单片机的TTL集成电路芯片测试仪的设计.pdfVIP

摘 要 集成电路（ IC ）测试是伴随着电子技术的发展而来的，数字集成芯片在使用 过 程中容易被损坏，用肉眼不易观察。早期的人工测试方法对一些集成度高， 逻辑复 杂的数字集成电路显得难于入手，因而逐渐被自动测试所取代，因此很需要 设计一 种能够方便测试常用芯片好坏的仪器。 本系统以单片机 AT89C52为核心, 由芯片测试插座、独立按键、 74HC573驱动8位 数码管显示、 5V直流电源控制模块等组成。根据数字集成芯片的引脚特性以 及集成 芯片的真值表编写测试程序。该系统能完成 14脚以内常用 TTL74、54系列数字集成芯 片的功能测试。 关键 字 ：测试仪；数字集成电路；单片机 1 ABSTRACT Integrated circuit (IC) test is accompanied with the development of electronic technology, Digital integrated chip is easily damaged during use, and difficult to observe with the naked eye. Early manual test methods for some high integration, the logic of complex digital integrated circuits become difficult ，thus gradually replaced by automated testing, so it is necessary to design a testing instrument to distinguish the Common chips is good or badconveniently. The system is with AT89C52 microcontroller at the core, including the chip test socket，the independent button, 74HC573drives an 8-bit digital display, 5V DC power supply control module and other components, etc. According to the characteristics of digital IC pins and the truth table write integrated chip test program. The system can be completedwithin 14 feet common TTL74, 54 seriesdigital integrated chipfunctional test. Keywords: tester; digital integratedcircuit; microprocessor control unit 2 目录 1 系统总体方案 ……………………………………………………………………… …..1 2 系统硬件电路设计 …………………………………………………………… 2 2.1 硬件系统电路原理框图 ………………………………… ……………