aec6 Electro-Thermally Induced Parasitic Gate Leakage (GL)汽车电子委员会.pdfVIP

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aec6 Electro-Thermally Induced Parasitic Gate Leakage (GL)汽车电子委员会.pdf

ISTFA ’93: The 19th International Symposium for Testing Failure Analysis, Los Angeles, California, USA / 15-19 November 1993 Electro-Thermally Induced Parasitic Gate Leakage (GL) R.D. Mosbarger Delco Electronics Kokomo, Indiana Abstract Failed parts recover and beco

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