day4交错扫描升降模式.pdfVIP

Overview Interleave is an advanced feature of NanoScope software which allows the simultaneous acquisition of two data types. After ea ain scan l race and retrace (in which topography is typically measured), a second (Interleave) trace and retrace is made with data acquired to produce an image concurrently with the main scan. Typical applications of interleave scanning lude MFM and EFM measurements Interleave Mode Lift Mode The tip first moves to the Lift start height, then to the Lift scan height. A large Lift start height can be used to pull the tip from the surface and eliminate sticking. The Lift scan height is the final tip height. This value is added point-by-point to the height data obtained during the Main topography trace and retrace. Values can be positive or negative. What’sthe Differenc ween Interleave and Lift Mode In Interleave Mode, the feedback is kept on while additional topography, phase, la l , or modulation data is acquired. In Lift Mode, the feedback is turned off and the tip is lifted to a user selected height above the surface to perform far field measurements such as MFM and EFM. By recording the cantilever deflection or resonance shifts caused by the ma ic or electric s on the tip, a ma ic or electric image is produced. Lift Mode was developed to isolate purely MFM and EFM data from topographic data. EFM/MFM Theory The cantilever is vibrated by a small piezoelectric element near its resonant frequency. The cantilever resonant frequency changes in response to any additional gradient. Attractive s make the cantilever effectively “softer,” reducing the cantilever resonant frequency. Conversely, repulsive s make the cantilever effectively “stiffer,” reasing the resonant frequency. Detection Methods mended detection methods: Phase Detection and Frequency Modulation. Phase and fre