- 0
- 0
- 约11.65万字
- 约 16页
- 2024-03-26 发布于重庆
- 举报
Designation:F374–00a
StandardTestMethodfor
SheetResistanceofSiliconEpitaxial,Diffused,Polysilicon,
andIon-implantedLayersUsinganIn-LineFour-PointProbe
withtheSingle-ConfigurationProcedure1
ThisstandardisissuedunderthefixeddesignationF374;thenumberimmediatelyfollowingthedesignationindicatestheyearof
originaladoptionor,inthecaseofrevision,theyearoflastrevision.Anumberinparenthesesindicatestheyea
原创力文档

文档评论(0)