- 8
- 0
- 约2.19万字
- 约 3页
- 2024-03-28 发布于重庆
- 举报
Designation:F616M–96(Reapproved2003)
METRIC
StandardTestMethodfor
MeasuringMOSFETDrainLeakageCurrent[Metric]1
ThisstandardisissuedunderthefixeddesignationF616M;thenumberimmediatelyfollowingthedesignationindicatestheyearof
originaladoptionor,inthecaseofrevision,theyearoflastrevision.Anumberinparenthesesindicatestheyearoflastreapproval.A
superscriptepsilon()indicatesaneditorialchangesincethelastrevi
原创力文档

文档评论(0)