nist -基于人工智能的扫描电子显微镜(SEM)尺寸计量的检测限 Detection limits of AI-based SEM dimensional metrology.pdfVIP

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nist -基于人工智能的扫描电子显微镜(SEM)尺寸计量的检测限 Detection limits of AI-based SEM dimensional metrology.pdf

DetectionLimitsofAI-basedSEMDimensionalMetrology

PeterBajcsy,BrycieWiseman,MichaelMajurski,AndrasE.Vladar

NationalInstituteofStandardsandTechnology,100BureauDr.Gaithersburg,MD20899

Thespeedofin-linescanningelectronmicroscope(SEM)measurementsoflinewidth,contact

hole,andoverlayiscriticallyimportantforidentifyingthemeasurementareaandgenerating

indispensableprocesscontrolinformation.Samplecharginganddamagetosensitiveintegrated

circuitstructuresrequirelowprimaryelectronbeamcur

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