nist -用于量子计算等低温应用的微机电系统(MEMS)开关可靠性表征 Characterizing MEMS Switch Reliability for Cryogenic Applications such as Quantum Computing.pdf

nist -用于量子计算等低温应用的微机电系统(MEMS)开关可靠性表征 Characterizing MEMS Switch Reliability for Cryogenic Applications such as Quantum Computing.pdf

ICMC2023IOPPublishing

IOPConf.Series:MaterialsScienceandEngineering1302(2024)012027doi:10.1088/1757-899X/1302/1/012027

CharacterizingMEMSSwitchReliabilityforCryoge

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