IEC TS 62804-12025 光伏组件.潜在诱发退化检测的试验方法.第1部分晶体硅标准立项发展报告.docxVIP

光伏组件潜在诱发退化检测试验方法第1部分：晶体硅标准立项发展报告

StandardizationDevelopmentReport:Photovoltaic(PV)Modules-TestMethodsfortheDetectionofPotential-InducedDegradation-Part1:CrystallineSilicon

摘要

关键词：光伏组件；潜在诱发退化；晶体硅；试验方法；国际电工委员会；可靠性检测；IECTS62804

Abstract

Withthecontinuousincreaseofglobalphotovoltaic(PV)installedcapacity,thelong-termreliabilityofPVmodulesunderrealoperatingconditionshasbecomeacriticalfactorconstrainingthehigh-qualitydevelopmentoftheindustry.Potential-InducedDegradation(PID),asoneoftheprimarydegradationmodesaffectingtheoutputpowerof