TI 集成电路手册 SBAA678 技术手册.pdf

ApplicationBrief

MeasurementCardsforSemiconductorAutomaticTest

Equipment(ATE)

SamihaSharifandJoshBrown

Introduction

Onechallengeinthetesterindustryismeetingthedemandforahighnumberoftestchannelswithout

significantlyincreasingtestertime,size,orcost.

您可能关注的文档

文档评论(0)

1亿VIP精品文档

相关文档