使用8051单片机验证和测试单粒子效应的设计外文原文.pdfVIP

Validation and Testing of Design Hardening for Single Event Effects Using the 8051 Microcontroller James W. Howard Jr., Senior Member, IEEE , Kenneth A. LaBel, Member, IEEE, Martin A. Carts, Member, IEEE, Christina Seidleck, Jody W. Gambles, Senior Member, IEEE, and Steven L. Ruggles Abstract - With the dearth of dedicated radiation hardened NASA the solution it needs to meet stringent science foundries, new and novel techniques are being developed for performance specifications in a timely, cost-effective, hardening designs using non-dedicated foundry services. In this and reliable manner. paper, we will discuss the implications of validating these methods for the single event effects (SEE) in the space However, one question still exists: traditional environment. Topics include the types of tests that are required radiation-hardened devices have lot and/or wafer and the design coverage (i.e., design libraries: do they need radiation qualification tests performed; what types of validating for each application?). Finally, an 8051 microcontroller core from NASA Institute of Advanced tests are required for HBD validation? Microelectronics (IAµE) CMOS Ultra Low Power Radiation Tolerant (CULPRiT) design is evaluated for SEE mitigative II. TESTING HBD DEVICES CONSIDERATIONS techniques against two commercial 8051 devices. Test methodologies in the United States exist to Index Terms – Single Event Effects, Hardened-By-Design, qualify individual devices through