Influence of atomic force microscope (AFM) probe shape on adhesion force measured in humidity environment.pdf

Influence of atomic force microscope (AFM) probe shape on adhesion force measured in humidity environment.pdf

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Influence of atomic force microscope (AFM) probe shape on adhesion force measured in humidity environment.pdf

Appl. Math. Mech. -Engl. Ed., 35(5), 567–574 (2014) Applied Mathematics DOI 10.1007/s10483-014-1813-7 and Mechanics c Shanghai University and Springer-Verlag Berlin Heidelberg 2014 (English Edition) Influence of atomic force microscope (AFM) probe shape on adhesion force measured in humidity environment∗ 1 2 1 Li YANG ( ) , Yu-song TU () , Hui-li TAN ( ) (1. College of Physics Science and Technology, Guangxi Normal University, Guilin 541004, Guangxi Province, P. R. China; 2. Institute of Systems Biology, Shanghai University, Shanghai 200444, P. R. China) Abstract In micro-manipulation, the adhesion force has very important influence on behaviors of micro-objects. Here, a theoretical study on the effects of humidity on the adhesion force is presented between atomic force microscope (AFM) tips and substrate. The analysis shows that the precise tip geometry plays a critical role on humidity depen- dence of the adhesion force, which is the dominant factor in manipulating micro-objects in AFM experiments. For a blunt (paraboloid) tip, the adhesion force versus humidity curves tends to the apparent contrast (peak-to-valley corrugation) with a broad range. This paper demonstrates that the abrupt change of the adhesion force has high correla- tion with probe curvatures, which is mediated by coordinates of solid-liquid-vapor contact lines (triple point) on the probe profiles. The study provides insights for further under-

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