Influence of atomic force microscope (AFM) probe shape on adhesion force measured in humidity environment.pdf
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Influence of atomic force microscope (AFM) probe shape on adhesion force measured in humidity environment.pdf
Appl. Math. Mech. -Engl. Ed., 35(5), 567–574 (2014) Applied Mathematics
DOI 10.1007/s10483-014-1813-7 and Mechanics
c
Shanghai University and Springer-Verlag
Berlin Heidelberg 2014 (English Edition)
Influence of atomic force microscope (AFM) probe shape on
adhesion force measured in humidity environment∗
1 2 1
Li YANG ( ) , Yu-song TU () , Hui-li TAN ( )
(1. College of Physics Science and Technology, Guangxi Normal University,
Guilin 541004, Guangxi Province, P. R. China;
2. Institute of Systems Biology, Shanghai University, Shanghai 200444, P. R. China)
Abstract In micro-manipulation, the adhesion force has very important influence on
behaviors of micro-objects. Here, a theoretical study on the effects of humidity on the
adhesion force is presented between atomic force microscope (AFM) tips and substrate.
The analysis shows that the precise tip geometry plays a critical role on humidity depen-
dence of the adhesion force, which is the dominant factor in manipulating micro-objects
in AFM experiments. For a blunt (paraboloid) tip, the adhesion force versus humidity
curves tends to the apparent contrast (peak-to-valley corrugation) with a broad range.
This paper demonstrates that the abrupt change of the adhesion force has high correla-
tion with probe curvatures, which is mediated by coordinates of solid-liquid-vapor contact
lines (triple point) on the probe profiles. The study provides insights for further under-
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