Sputter depth profiling of thin films with LEIS and LENRS》.pdfVIP

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Sputter depth profiling of thin films with LEIS and LENRS》.pdf

Sputter depth profiling of thin films with LEIS and LENRS》.pdf

180 Applied Surface Science 28 (1987) 180-186 North-Holland, Amsterdam SPUTTER DEPTH PROFILING OF THIN FILMS WITH LEIS AND LENRS S.G. PURANIK and B.V. KING Physics Department, University of Newcade, N.S. W. 2308 Australia Received 28 July 1986; accepted for publication 22 November 1986 Low energy ion scattering spectroscopy (LEIS) and low energy negative recoil spectroscopy (LENRS)

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