《测量射频及微波器件的电性能.》.pdfVIP

The treatment given here is introductory, and will assist the reader who wishes to consult the standard texts for further detail on measurement techniques. For measurements on mixers and frequency doublers, please refer to the applications notes on these subjects. Linear Measurements, Passive and Active Devices The instrumentation shown in Figure 1 can be used for a broad range of measurements on devices having one port. two ports, or many ports. Three representative devices are indicated. Properly calibrated per the instrument manufacturers instructions, the setup will measure the following characteristics as functions of frequency: Insertion Loss, VSWR, Gain, Isolation, Directivity, Amplitude Unbalance, Phase Unbalance, Group Delay The S-parameter test set measures four sets of magnitude-and-phase quantities. When the network analyzer commands a signal to be outputted by Port 1, the signal reflected back to Port 1 by the D.U.T. (device under test) is detected and displayed as S11, while the signal passing through the D.U.T. and detected at Port 2 is displayed as S21. Similarly, a signal outputted by Port 2 yields S22, and that portion of the signal originating at Port 2 which passes through the D.U.T. to Port 1 becomes S12. Before connecting the D.U.T., the test set is calibrated by storing reference reflection and transmission data in the network analyzer. For reflection, each cable which will later go to the D.U.T. has precision short, open, and matched load terminations successively connected to it. For transmission, the two cables are joined directly together for a through connection. Now, consider a two-port D.U.T. Suppose the input port of the D.U.T. is connected to Port I of the test set, and the output is connected to Port 2. The magnitudes of S11 and S22, expressed in dB, will be negative or zero because the reflected power is less than, or at most equal to, the incident power