AVX固体钽容漏电流分析.docVIP

ANALYSIS OF SOLID TANTALUM CAPACITOR LEAKAGE CURRENT 固体钽电容漏电流分析 Abstract:摘要 Abstract: 摘要 The leakage current of a solid tantalum capacitor is the sum of several independent factors. From measurements of leakage over a range of test conditions some degree of separation of these components of the current can be achieved and so the relative importance of factors leading to high leakage can be assessed. There is a background level present directly related to dielectric absorption and it contributes to the loss factor of the capacitor. It is not a true leakage. On top of this absorption current there are other components, most of which are essentially by-passing the bulk of the dielectric. These can be moisture or manganese dioxide tracks or breakdown sites in the dielectric layer. These typical behavior patterns are described in detail. 固体钽电容器的漏电流是几个独立因素之和，对各种条件下漏电流的测量，可以一定程度将这些漏电流成分分开，因此相对重要的大漏电流因素可以评估出来。有直接的背景涉及到介质吸收，它对电容器的损耗因子有贡献。它不是真正的漏电流。另外，紧接着吸收电流的是其它成分，大多数在本质上是介质本体的旁路电流。这些可能是潮汽或二氧化锰轨迹或介质层的击穿点造成的。这些典型的行为方式也会详细介绍。 The leakage current of a solid tantalum capacitor is the sum of several independent factors. From measurements of leakage over a range of test conditions some degree of separation of these components of the current can be achieved and so the relative importance of factors leading to high leakage can be assessed. 固体钽电容的漏电流是几个独立因素的总和， 在一定测试条件范围内对漏电流可以得到某种程度的分开的量值，所以，可以对导致漏电流大的重要因素进行评估。 There is a background level present equivalent to a dielectric resistivity of about 1016 ohm cm. This background is directly related to dielectric absorption and it contributes to the loss factor of the capacitor. It is not a true leakage insofar as it can be recovered when the capacitor is discharged. It is proportional to voltage and, over the period usually employed for leakage current measurements, is inversely proportional to time. 这里有一个大约为1016Ωcm介质电阻率的参考背景。此背景直接与介质吸收相联系，并对电容器的损耗因子有贡献。它并不是真正意义上的漏电流，因为在电容器放电时可以恢复。它与电压成正比，并在测量漏电流期间与时间成反比。 On top of this absorption curren