材料现代分析测试方法rietveld.pptVIP

李均钦、刘福生 深圳大学材料学院 2008.10 五、Rietveld结构精修 根据初始的结构模型，计算出衍射图谱，通过与实验图谱进行全谱对比，进一步优化结构模型的方法。 History Review Rietveld originally introduced the Profile Refinement method (Using step-scanned data rather than integrated Powder peak intensity) (1966,1967) Rietveld developed first computer Program for the analysis of neutron data for Fixed-wavelength diffractometers (1969) Malmos Thomas first applied the Rietveld refinement method (RR) for analysis of x-ray powder data collected on a Ginier Hagg focusing Camera (1977) Khattack Cox first applied the RR to x-ray powder data collected on a diffr