用法布里波罗测钠双线波长差和膜厚度.doc

光学设计实验 用法布里干涉仪测量钠双线的波长差及膜厚度 学生姓名：尹怡松 指导教师： 所在学院：物理学院 所学专业：物理学 中国·长春 2013 年 6 月 题目 用法布里干涉仪测量钠双线的波长差及膜厚度 中文摘要 1899年法国物理学家法布里和珀罗创制了以他们名字命名的法布里－珀罗干涉仪（简F-P干涉仪）。利用多光束干涉的原理，可以获得细锐明亮且暗纹较宽的明条纹，因此，它是研究光谱的超精细结构的有效工具。本实验应用其该特点，测量钠双线的波长差及膜厚度。论文涉及到了实验仪器、实验原理、实验步骤、数据记录及处理、注意事项，并且对一些问题进行了分析解释。本文也对迈克尔逊干涉仪和法布里珀罗两种仪器及干涉条纹现象作了比较。 等倾干涉入射光经薄膜上表面反射后得第一束光，折射光经薄膜下表面反射，又经上表面折射后得第二束光，这两束光在薄膜的同侧，由同一入射振动分出，是相干光，属分振幅干涉。若光源为扩展光源（面光源），则只能在两相干光束的特定重叠区才能观察到干涉，故属定域干涉。对两表面互相平行的平面薄膜，干涉条纹定域在无穷远，通常借助于会聚透镜在其像方焦面内观察。 关键词 法布里—珀罗干涉仪；多光束干涉；钠双线；膜厚度。 英文摘要 In 1899, the French physicist Fabry and Perot created Fabry Perot interferometer that named after their names (F-P interferometer). Use of multiple beam interference principle, we can obtain fine sharp bright fringe with wide dark lines, therefore, it is an effective tool to study the hyperfine structure spectra. Apply this characteristics, measure the wavelength difference of sodium doublet and film thickness. The paper relates to the experimental apparatus, experimental principle, experimental procedures, data recording and processing, attention, and some problems are analyzed and explained. This passage also compare the interference fringe phenomenon of Michelson interferometer and Fabry-Perot interferometer . Incident light of equal inclination interference reflect on the film surface to be the first light beam, refraction light through the film under surface reflect and refract through the upper surface to be the second light beam, this two beam of light in the same side of thin film, from the same incident vibration separation, is coherent light, is the component amplitude interferometry. If light source is extended light, only in two coherent specific overlap area ,we can observe interference, it is localized interference. For the flat film that two surface parallel to each other, interference fringe is localized at infinity, with the help of a converging lens, it can be observed in the im