Efficient Storage of Defect Maps for Nanoscale Memory纳米级存储器缺陷映射的有效存储.pptxVIP

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Efficient Storage of Defect Maps for Nanoscale Memory纳米级存储器缺陷映射的有效存储.pptx

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Efficient Storage of Defect Maps for Nanoscale Memory Susmit Biswas Tzvetan S. Metodi* Frederic T. Chong Ryan Kastner Tim Sherwood {susmit,chong,sherwood}@cs.ucsb.edu, kastner@ece.ucsb.edu, tsmetodiev@ucdavis.edu * April 16, 2017 Nanotechnology in Action Scaling limit of CMOS Vdd ~ 1V Leakage Design of new nanoscale devices SONOS, CMOL, Crossbar memories CNT interconnect April 16, 2017 Nanotechnology: Pros and Cons Higher Density 5nm=Fnano = 10nm Faster operation Fast switching Low active power Inexpensive Reliability Manufacturing defects might be as high as 10% [DeHon-NanoTech2005] April 16, 2017 Solution: Reconfiguration Dynamic High latency in testing Static: Defect Map Using bit-level reconfiguration High overhead in storage Block level reconfiguration Efficient storage techniques ! April 16, 2017 Presentation overview Motivation Prior Work Our Approach Algorithms Results Conclusion April 16, 2017 Prior Work 1D list of regions [sun-NanoArch-06] Bloom filter defect map [Wang-ICCAD2006] April 16, 2017 Example: A Defective Memory April 16, 2017 Map of good regions List based approach Ranges 1D 2D Can be stored in TCAM Good for correlated defects April 16, 2017 Storing Defect Map in Rectangles April 16, 2017 Equivalent Problem:Finding optimal rectangle cover NP-Complete problem Greedy Algorithm R-Tree as data structure New point inserted greedily for least increase in rectangle area Suitable for storing ranges k-means clustering to decide the insertion order of points April 16, 2017 Algorithm April 16, 2017 Algorithm 1: Illustration R3 R4 R5 R6 Root R2 R1 April 16, 2017 Storing Sparse Defect Locations Bloom filter defect map [Wang-ICCAD2006] Supports membership queries Uniform hash function No false negative False positive Better storage efficiency than bit vector 0 1 0 1 0 0 1 0 0 1 H2 (d1) H1(d1) H3 (d1) H4 (d1) D={d1, d2,…, dn} April 16, 2017 Bloom filter as Defect Map m/n fp 2 0.393 3 0.237 4 0.147 5 0.092 6 0.0561 7 0.0347 8 0.0216 9 0.0133 10 0.00819