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Photocurrent spectra of semi-insulating GaAs M–S–M diodes Role of the contacts.pdf
Solid-State Electronics 118 (2016) 30–35
Contents lists available at ScienceDirect
Solid-State Electronics
journal homepage: /locate/sse
Photocurrent spectra of semi-insulating GaAs M–S–M diodes: Role
of the contacts
Franti?ek Dubecky′ a,?, Jirˇí Oswald b, Dobroslav Kindl b, Pavel Hubík b, Matú? Dubecky′ c, Enos Gombia d, Andrea ?agátová e, Pavol Bohácˇek a, Mária Sekácˇová a, Vladimír Necˇas e
a Institute of Electrical Engineering, SAS, Dúbravská cesta 9, SK-84104 Bratislava, Slovakia b Institute of Physics, ASCR, v.v.i., Cukrovarnická 10, CZ-16200 Praha 6, Czech Republic c Department of Physics, Faculty of Science, University of Ostrava, 30. dubna 22, CZ-70103 Ostrava 1, Czech Republic d C.N.R.-IMEM Institute, Parco Area delle Scienze 37/A, I-43124 Parma, Italy e Faculty of Electrical Engineering and Information Technology, SUT, Ilkovicˇova 3, SK-81219 Bratislava, Slovakia
article info
Article history: Received 17 August 2015 Received in revised form 22 December 2015 Accepted 7 January 2016 Available online 23 January 2016
Keywords: Photocurrent spectroscopy Semi-insulating GaAs Detectors Contacts
abstract
Current–voltage (I–V) characteristics and photocurrent (PC) spectra (600–1000 nm) of the metal–semi conductor–metal (M–S–M) structures based on high-quality undoped semi-insulating (SI) GaAs with AuGeNi backside contact and different semitransparent top contacts (AuGeNi, Pt, Gd and Nd) are reported, and analysed with the help of a simple physical model. It is shown that the dominant peak in the PC spectra and the change of photocurrent sign can be explained by a presence of two Schottky-like barriers at the top and bottom surfaces. In addition, I–V and PC results show dependence on the bias and its polarity, and on the contact metal used. The possible origins of these effects are discussed.
ó 2016 Elsevier Ltd. All rights reserved.
1. Introduction
Semi-insulating (SI) GaAs has become an important candidate for the fabrication of monolithic X-ray and particle det
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