MicrostructureAnalysis,MetallographyandMechanicalTesting.pdfVIP

e r u h c o r b s ’ e t u t i t s n I Microstructure Analysis, Metallography and Mechanical Testing of Materials Institute of Materials Research Microstructure The resolution of the field emission scanning electron microscope (Zeiss Ultra Analysis and 55) is 1 nm at an acceleration voltage of 15 keV, and a resolution of even 4 nm at Metallography 100 eV is attained. Besides the usual Everhart-Thornely and BSE detectors, the microscope is also equipped with an in- is one of the core teams of the Insti- lens secondary as well as an in-lens BSE tute for Materials Research. Here, detector for high resolution imaging. the fundamental characterisation of materials is carried out. For this pur- An EDS system (Oxford INCA) permits pose, an analytical scanning electron quantitative elemental analysis, quan- microscope and an analytical trans- titative line scans and quantitative mission electron microscope are elemental mapping. Furthermore, a installed. Furthermore, an X-ray pow- modern EBSD attachment (Oxford Nordlys der and a texture diffractometer, a II / Channel 5) for crystallographic phase micro hardness tester and a variety and texture analysis is attached. of metallographic optical micro- scopes are available. Moder