Choice of a High-Level Fault Model for the Optimization of Validation Test Set Reused for Manufacturing Test英文文献资料.docVIP

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Choice of a High-Level Fault Model for the Optimization of Validation Test Set Reused for Manufacturing Test英文文献资料.doc

Choice of a High-Level Fault Model for the Optimization of Validation Test Set Reused for Manufacturing Test英文文献资料

HindawiPublishingCorporation VLSIDesign Volume2008,ArticleID596146,9pages doi:10.1155/2008/596146 ResearchArticle ChoiceofaHigh-LevelFaultModelfortheOptimizationof ValidationTestSetReusedforManufacturingTest YvesJoannon,1,2VincentBeroulle,1ChantalRobach,1SmailTedjini,1andJean-LouisCarbonero2 1 2 GrenobleInstituteofTechnology(LCIS),50RueB.deLa?emas,BP54,26092ValenceCedex9,France STMicroelectronics,850RueJeanMonnet,38926CrollesCedex,France CorrespondenceshouldbeaddressedtoYvesJoannon,yves.joannon@esisar.inpg.fr Received11October2007;Accepted9April2008 RecommendedbyBozenaKaminska With the growi

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Choice of a High-Level Fault Model for the Optimization of Validation Test Set Reused for Manufacturing Test英文文献资料.docVIP