A Rigorous Temperature-Dependent Stochastic Modelling and Testing for MEMS-Based Inertial Sensor Errors.docVIP

Sensors 2009, 9, 8473-8489; doi:10.3390/OPEN ACCESS sensors ISSN 1424-8220 /journal/sensors Article A Rigorous Temperature-Dependent Stochastic Modelling and Testing for MEMS-Based Inertial Sensor Errors Mohammed El-Diasty* and Spiros Pagiatakis Department of Earth and Space Science and Engineering, York University, Toronto, ON M3J 1P3, Canada; E-Mail: spiros@yorku.ca * Author to whom correspondence should be addressed; E-Mail: eldiasty@yorku.ca; Tel: +1-416-736-2100 ext.33136; Fax: +1-416-736-5817. Received: 6 August 2009; in revised form: 12 September 2009 / Accepted: 12 October