基于电子倍增CCD噪声特性的最佳工作模式_张闻文.pdfVIP

16 10 Vol. 16 No. 10 2008 10 Opt ics and Precision Engineering Oct. 2008 ( 2008) 102 19772 0 CCD 张闻文, 陈 钱 ( 南京理工大学 电子工程与光电技术学院, 江苏 南京2 10094) :CCD , , , , , CCD , CCD :( 293 K) 1. 6 Ls 1. 6 L s , ; 1. 6 L s , CCD :; ;; CCD :TN386. ;TN 1 2 :A Op timum oper at ion mode based on n oise characteristics of elect ron multiplying CCD ZHANG Wen2wen, CHEN Qian ( School of El ectr onic E ngineering Opt oelectr onic T echnology , N anj ing Univer sity of Science Technology , N anj ing 210094, China) Abstr act : In or der to obtain the best work state and optimum imaging quality for an electron multipl2 ying CCD, the noise character istics of electron multiplying CCDs are studied and used to select the op2 timum oper ation mode. The oper ation principles of inverted mode and non2inverted mode are intro2 duced. The per formance of dark current and clock induced char ge is analyzed and compared with dif2 ferent operation modes. A mathematical model of optimum operation mode is established by taking operation temperature, integration time and total number of parallel transfer s as parameters. Then, integration critical point is calculated to determine the optimum oper ation mode. Finally, the curve of noise per formance in optimum operation mode is simulated according to the parameters of practical de2 vices. The simulation results indicate that the integr ation critical point is 1. 6 Ls at room temperature (293 K) . When integration time is longer than 1. 6 Ls, the inverted mode is optimum oper ation mode, and when integration time is less than 1. 6 Ls, the non2inverted mode is preferable. The results offer a reliable theor etical basis fo