ZnO_玻璃系压敏电阻老化特性研究_付明.pdfVIP

第6 期 电 子 元 件 与 材 料 Vol.23 No.6 2004 年6 月 ELECTRONIC COMPONENTS MATERIALS Jun. 2004 敏感元器件 ZnO –玻璃系压敏电阻老化特性研究 付 明，余 豪，周东祥 （华中科技大学电子科学与技术系，湖北 武汉 430074） 摘要:研究了 ZnO –玻璃系压敏电阻的直流老化特性、交流老化特性和大电流冲击老化特性。在恒定直流偏压作 用下，ZnO –玻璃系压敏电阻伏–安特性出现非对称性蜕变，非欧姆特性降低。在交流偏压作用下，ZnO –玻璃系压 敏电阻伏–安特性出现对称性蜕变。在脉冲大电流作用下，其伏安特性也呈现出非对称性蜕变。适当的低熔点氧化物 和一价离子掺杂可改善样品的老化性能。还利用原子缺陷势垒模型对几种老化现象进行了理论分析。 关键词:ZnO –玻璃系；压敏电阻；老化特性；肖特基势垒 中图分类号: TN304.93 文献标识码:A 文章编号:1001-2028 （2004 ）06-0017-03 Research on Degradation Characteristics of ZnO-glass Varistors FU Ming, YU Hao, ZHOU Dong-xiang (Department of Electronic Science and Technology, Huazhong University of Science and Technology, Wuhan 430074, China) Abstract: Studied were the degradation characteristics of ZnO-glass varistors under a DC stress, an AC stress or an impulse load. The voltage-current characteristics of ZnO-glss varistors were deformed asymmetrically under a DC bias, and deformed symmetrically under an AC bias, characterized that nonlinear coefficients of samples decreased. The V-I curve was also deteriorated asymmetrically after large current impulse. The aging properties could be improved by doping a proper amount of low melting point oxides and mono-valent ions. The aging mechanisms were investigated by using atomic defect barrier model. Key words: ZnO-glass system; varistor; degradation characteristics; Schottky barrier 随着电子技术的日益发展，对叠层片式压敏电阻 特点，笔者在ZnO –玻璃系压敏材料前期研究的基础 的需求量迅速增加。片式压敏电阻具有体积小、压敏 上，详细研究了该材料的各种老化现象和机理，为研 电压低、通流能力强以及适合表面贴装技术要求等特 究出高性能、高稳定性的片式压敏电阻打下了