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单片机自动检测系统的设计_王小利（国外英文资料）
单片机自动检测系统的设计_王小利（国外英文资料）
The first
The first 29 volume
4
Laboratory research and exploration
Vol.
29
No.
4
In 2010,
RESEARCH in April
The AND
EXPLORATION
The IN
LABORATORY
Apr.
2010
The design of automatic test system for single chip microcomputer
Wang xiaoli, dong xiaozhou
(weihai university, shandong university, weihai, shandong university
264209).
Abstract: a complex programmable logic device is designed
(
CPLD, for the control of the core detection system, can realize the automatic inspection of single chip machine damage
Measurement. System is mainly composed of
The CPLD control module, JTAG, and the download module, the serial port transceiver module and the single-chip type conversion board. CPLD
First automatic detection of single chip microcomputer
After the ISP downloads the complete signal, it starts to communicate with the single chip, then analyzes the processing and writing
The data of the single chip machine is identical, and the serial communication works. Continue to test the single chip
GPIO, and the sync display is the main one
Whether the function is working properly, can directly judge the good and bad of the single chip. The system test automation is compared with traditional single chip test technology
High degree, high detection rate and fast test.
keywords
: single chip microcomputer
; Automatic test
; Complex programmable logic devices
Chinese library classification,
TM:
930.12
+ 1 document identifier
: A article number
: 1006-7167
(2010) 4-0052-03
The Design
of
MCU
Automatic
The Test
The System
WANG,
Xiao li,
DONG
Xiao zhou -
(School
of
Information
Engineering, Shandong
University
The at
Weihai, Weihai
264209, China)
The Abstract:
The
controllable
The core
of
this
The system, which?
can
automatically
detect
the
The problems
of
MCU, is
the
complex
programmable
Logic.
devices
(CPLD).
This
The system
is
composed
mainly
of
the
The control
The module
of
CPLD, the
The module
of
The parallel
The download, serial
Transceiver.
First, the
automatic
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