实验二 TTL集成逻辑门的逻辑功能与参数测试（国外英文资料）.doc

实验二 TTL集成逻辑门的逻辑功能与参数测试（国外英文资料） Experiment 2 TTL integration logic gate logic function and parameter test One, the purpose of the experiment The test method for TTL and non-gate logic functions; The measure of TTL and non-gate parameters; Be familiar with the structure and usage of the test case of the th-sz digital circuit. Second, the requirement of preparation What is the TTL integrated circuit? What is the voltage that it USES? What should be done with the input side of TTL and non-gate? Review the logic function of TTL and non-gate, the concept and measurement method of main parameters; TTL and non-gate output characteristic curves? Read the relevant parameter values from it; Third, the experimental principle The logical function of the non-gate When one or more of the input is low, the output is high level; The output is low level only when the input is fully charged. The 0 has 1 and 0. Its logical expression is Y = EMBED x.3. This experiment USES four input pairs and non-gate 74LS20, which means two separate and non-gate in one piece, each with four input terminals. The logical signs and pins are shown in figure 2-1 (a) (b) : Y = EMBED Equation. 3 1 2 3 4 5 6 7 (a) the national standard logic symbol (b) 74LS20 is arranged Figure 2-1, 74LS20 national standard logical symbols and pins Iv. Experimental devices The th-sz digital circuit experiment box Digital multimeter UT56 3. 74 ls20 TTL and not gate 4. A number of wire Fifth, the experiment content Validate TTL and non-gate 74LS20 logic Select a 14-foot integrated block socket in the appropriate location and follow the line in figure 2-2. Each door of 4 input end (hypothesis for A, B, C, D) logical switch output pins, to provide A 0 and 1 level signal (switch upward, output 1, down to 0). The output of the door (assuming Y) is LED by LED, LED to output 1, and 0 for output. Test the logical function of two and non-gates in the integration block by table 2-1. Table 2-1, 74LS20 truth table Lose the A1 (1) B (2) C1