界面化学表面能γ.PPT

FIG. (color). (a) STM image of In nanoclusters on Si(111) at an In coverage of 0.05 ML (1 ML one adsorbed atom per substrate atom). (b) Perfectly ordered In nanocluster arrays at 0.12 ML In coverage. (c) I-V curves measured on bare Si surface (red) and on top of In clusters (green). 纳米材料性质特点： 过渡亚稳态物质：介于宏观与微观之间，具有特殊的 表面结构 效应：特殊的表面和界面效应，临界尺寸效应， 量子尺寸效应 量子隧道效应 物理/化学特性：熔点显著降低 吸收光和电磁波能力增强 表面活性提高 第六讲 界面化学 第六讲 界面化学 纳米技术之一 － 扫描探针显微术（SPM） 扫描隧道显微术(STM) 原子力显微术(AFM) 磁力显微术(MFM) 应用： 超高空间分辨本领：获取表面原子分子的大小形状和堆积信息 针尖产生局域场：构建微结构 和 微器件 分辨力和控制力：研究单分子结构和性质 Scanning Tunneling Microscopy(STM) ? The tunneling current is measured by W needle ? The distance between the tip and sample surface is below 1 nm; resolution along vertical is 0.01nm and in transverse is 0.1nm ? The tip is applied a few voltage and the tunneling current is 0.1 to 1.0 nA ? The current is related not only to the height of atom on the surface, but also to the atomic density (density state) Scanning electron microscopy image of a square array of electodeposited Ni pillars of high 300nm and period. Low noise, high density 硅晶体结构隧道扫描 Atomic Force Microscopy (AFM) STM is only applied to bserve surface for conductor or semi-conductor, while AFM is an ppropriate tool for all samples. The reflect light place is 3-10nm after the height of tip changes 0.01nm. Three operation models of AFM: contact (2) non-contact (3) tapping model. 第六讲 界面化学 Geometry for description of MFM technique. A tip scanned to the surface and it is magnetic or is coated with a thin film of a hard or soft magnetic material. Magnetic Force Microscopy (MFM) Domain structure of epitaxial Cu/tNi /Cu(100) films imaged by MFM over a 12 μm square: (a) 2nm Ni, (b) 8.5 nm Ni, (c) 10.0 Nm Ni; (d) 12.5nm Ni (Bochi et al., PRB 53(1996)R1792). Domain pattern as measured by MFM above