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Determining the Effects of Package Parasitics on (确定包寄生的影响)
Determining the Effects of Package Parasitics
on SI and EMC Performance
Douglas C. Smith
D. C. Smith Consultants
P. O. Box 1457, Los Gatos, CA 95031
Tel: 408-356-4186, Fax: 408-358-3799, Email: doug@
Copyright © 2007 International Microelectronics and Packaging
Society. Reprinted from the 2007 IMAPS Symposium Proceedings.
This material is posted here with permission of the International
Microelectronics and Packaging Society. Internal or personal use of this
material is permitted. However, permission to reprint/republish this
material for advertising or promotional purposes or for creating new
collective works for resale or redistribution must be obtained from the
International Microelectronics and Packaging Society.
International Microelectronics and Packaging Society
Web:
611 2nd Street, NE
Washington, DC 20002
By choosing to view this document, you agree to all provisions of the
copyright laws protecting it.
Determining the Effects of Package Parasitics on SI and EMC Performance
Douglas C. Smith
D. C. Smith Consultants
P. O. Box 1457, Los Gatos, CA 95031
Tel: 408-356-4186, Fax: 408-358-3799, Email: doug@
Abstract
Signal Integrity and EMC problems are significantly affected by integrated circuit package parasitics. Such
effects can be especially problematical for cases where devices undergo a die shrink in the same package. A simple
method of determining the effects of package parasitics for a broad class
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