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nzno薄膜的受主性质研究 research on acceptor nature of the n zno thin films
第3z卷第2期 固体电子学研究与进展 V01.32,N。.2
2012年4月 RESEARCHPROGRESSOFSSE Apr..2012
N:ZnO薄膜的受主性质研究
黄世震 翁 坤’
(福州大学,福建省微电子集成电路重点实验室,福州,350002)
2011—11-17收稿。2011-12—30收改穑
z
摘要:使用溶胶一凝胶法制备N Zn0薄膜。用X射线衍射仪(XRD)对晶体结构进行表征,用扫描电子显微镜
(SEM)观察薄膜表面形貌,用荧光光谱仪测量低温(8K)及变温条件(8~200K)下的光致发光(PL)光谱。分析了
各个发射峰的形成机理,通过薄膜缺陷态发光和受主能级的关联性,计算出了N作为受主所需电离能的大小在
0.255~0.31
eV范围内.研究结果为以
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