谱差分析技术的小麦蚜虫危害等级监测研究.docVIP

基于谱差分析技术的小麦蚜虫危害等级监测研究 罗菊花,2，黄文江1 *，董莹莹3，张竞成1，赵晋陵1,王锦地2 （1.北京农业信息技术研究中心，北京 100097； 2.北京师范大学地理学与遥感科学学院 遥感科学国家重点实验室，北京 100875; 3.浙江大学农业遥感与信息技术应用研究所，浙江 杭州 310029） 摘要：本研究应用可见光和近红外范围的光谱数据，采用相关曲线拟合分析法，以正常小麦样点的平均光谱曲线作为基谱，对小麦蚜虫不同危害程度的光谱相对于基谱的光谱差异进行了比较分析。研究发现，小麦蚜虫不同危害程度的相关拟合曲线趋近于直线（拟合的R20.99）， 且随着小麦蚜虫危害程度的加重，相关拟合直线的斜率明显减小; 且当选取波段为400-810 nm时，用相关曲线拟合法得出的各样点相对于基谱的拟合直线斜率与小麦蚜虫危害等级之间的相关性最大，其构建模型的R2=0.900，可以用来反演灌浆期小麦的蚜虫危害等级。因此，基于可见/近红外波段能够实现对小麦灌浆期的蚜虫危害等级的准确监测。 关键字：谱差分析技术；可见光/近红外光谱；小麦蚜虫；相关曲线拟合法 中国分类号 O657.3 S127 文献标识码：A Monitoring Wheat Aphid Damage Levels Based on Spectral Difference Analysis LUO Juhua1,2, HUANG Wenjiang1 *, DONG Yingying3, ZHANG Jingcheng1,ZHAO Jinling1, WANG Jidi2 （1. Beijing Research Center for Information Technology in Agriculture, Beijing 100097, China; 2. State Key Laboratory of Remote Sensing Science, College of Geography and Remote Sensing Science, Beijing Normal University, Beijing 100875, China； 3. Institute of Agricultural Remote Sensing Information System Application, Zhejiang University, Hangzhou 310029, China;） AVisible and near-infrared reflectance measurements of healthy winter wheat and infected by aphid were acquired by ASD FieldSpec Pro spectrometer at the canopy level, and the Correlation Simulating Analysis Model (CSAM) with average spectral of healthy wheat as based spectrum was used to discriminate from aphid damage levels. It is concluded that the correlation curves which are obtained by reflectance of samples to based spectrum are near to straight line (R20.99), and the slopes of fitting lines are decreasing with aphid damage levels becoming serious. Moreover, in the range from 400 to 810 nm, the correlation between the slopes of fitting line and aphid damage levels is the best (R2=0.900) to establish the model of monitoring aphid damage levels. So the aphid damage levels can be monitored exactly using visible and near-infrared reflectance spectroscopy technique. Key words: